Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2011-01-25
2011-01-25
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S107000, C702S124000, C702S126000, C327S100000, C327S524000
Reexamination Certificate
active
07877236
ABSTRACT:
An integrated circuit includes a first storage location, a first generator, a converter, and a second generator. The first storage location is operable to store a first adjustment value. The first generator is coupled to the first storage location, is operable to generate a first signal having a first characteristic, and includes a first adjuster operable to change the first characteristic in response to the first adjustment value. The converter is coupled to the first storage location and is operable to generate from the first adjustment value a modified adjustment value. The second generator is coupled to the converter, is operable to generate a second signal having a second characteristic, and includes a second adjuster operable to change the second characteristic in response to the modified adjustment value.
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Nam Kijun
Seo Donghyun
Yoon Seokseong
Graybeal Jackson LLP
Hynix / Semiconductor Inc.
Jablonski Kevin D.
Jorgenson Lisa K.
STMicroelectronics Asia Pacific Pte Ltd
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