Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2007-09-18
2007-09-18
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C700S028000, C700S054000, C702S057000, C702S064000, C702S107000, C713S300000, C713S340000
Reexamination Certificate
active
11364741
ABSTRACT:
A method for trimming reference voltage circuitry includes defining a desired target reference voltage for a set of at least one die. At least two reference voltages are measured for at least two different trim settings associated with a given die of the at least one die. A modified target reference voltage is determined for the given die based on the at least two measured reference voltages. A trim setting associated with the reference voltage circuitry of the given die is set according to the modified target reference voltage so as to compensate for an offset voltage and substantially achieve the desired target reference voltage.
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John Constantopoulos and Walter Nadler, “Power Chips Benefit From Final-Test Trim”, Power Electronics Technology, www.powerelectronics.com, Mar. 2005, pp. 52-55.
John Soji K.
Mayhugh Terry L.
Nguyen Baoson
Cosimano Edward R
Neerings Ronald O.
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