Trimmed integrated circuits with fuse circuits

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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Details

C361S104000, C438S132000

Reexamination Certificate

active

09970074

ABSTRACT:
A wafer containing integrated circuits having fuses which are selectively blown to trim circuit perimeters. The fuses are located adjacent scribe lanes, and fuse pads are located in the scribe lanes. The integrated circuits are trimmed by selectively energizing the fuse pads to blow selective fuses. When the integrated circuits are severed from the wafer, the fuse pads are severed from the integrated circuits.

REFERENCES:
patent: 3974443 (1976-08-01), Thomas
patent: 4024561 (1977-05-01), Ghatalia
patent: 4319396 (1982-03-01), Law et al.
patent: RE32625 (1988-03-01), Schwarz et al.
patent: 4801869 (1989-01-01), Sprogis
patent: 4918377 (1990-04-01), Buehler et al.
patent: 4935645 (1990-06-01), Lee
patent: 5897193 (1999-04-01), Nishino
patent: 5994170 (1999-11-01), Pedersen et al.
patent: 6006169 (1999-12-01), Sandhu et al.
patent: 6028756 (2000-02-01), Freyman et al.
patent: 6108804 (2000-08-01), Derner
patent: 6121677 (2000-09-01), Song et al.
patent: 6175261 (2001-01-01), Sundararaman et al.
patent: 6211745 (2001-04-01), Mucke et al.
patent: 6365443 (2002-04-01), Hagiwara et al.
patent: 6548826 (2003-04-01), Fenner et al.
patent: 6627917 (2003-09-01), Fenner et al.
patent: 6806494 (2004-10-01), Fenner et al.
patent: 01093141 (1989-04-01), None
patent: 10256324 (1998-09-01), None
patent: 200124279 (2000-04-01), None
V. Ryan, Acceleration of Stress-Migration Failure in Aluminum Interconnect, Jun. 17, 1992, pp. 1-13.
V. Ryan, Enhanced Stress-Migration Reliability for ULSI Interconnect: An Insight into the Perils of Screening A1 Depositions Based on Grain Size, 1995.
F.G. Yost, Stress-Voiding of Narrow Conductor Lines, 1990, pp. 40-44.

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