Semiconductor device manufacturing: process – Making regenerative-type switching device
Reexamination Certificate
2007-09-12
2009-11-10
Purvis, Sue (Department: 2826)
Semiconductor device manufacturing: process
Making regenerative-type switching device
C257SE21361
Reexamination Certificate
active
07615417
ABSTRACT:
An ESD protection circuit is formed at the input/output interface contact of an integrated circuit to protect the integrated circuit from damage caused by an ESD event. The ESD protection circuit has a polysilicon bounded SCR connected between a signal input/output interface contact of the integrated circuit and a power supply connection of the integrated circuit and a biasing circuit. The biasing circuit is connected to the polysilicon bounded SCR to bias the polysilicon bounded SCR to turn on more rapidly during the ESD event. The biasing circuit is formed by at least one polysilicon bounded diode and a first resistance. Other embodiments of the biasing circuit include a resistor/capacitor biasing circuit and a second diode triggering biasing circuit.
REFERENCES:
patent: 5159518 (1992-10-01), Roy
patent: 5453384 (1995-09-01), Chatterjee
patent: 5629544 (1997-05-01), Voldman et al.
patent: 6534834 (2003-03-01), Ashton et al.
patent: 6580184 (2003-06-01), Song
patent: 6605493 (2003-08-01), Yu
patent: 6610262 (2003-08-01), Peng et al.
patent: 7285458 (2007-10-01), Manna et al.
patent: 2002/0145164 (2002-10-01), Kunz et al.
patent: 2003/0016479 (2003-01-01), Song
Umesh Sharma et al., An ESD Protection Scheme for Deep Sub-micron ULSI Circuits, Symposium on VLSI Technology Digest of Technical Papers, 1995, pp. 85-86.
S. Voldman et al., Electrostatic Discharge (ESD) Protection in Silicon-on-Insulator (SOI) CMOS Technology with Aluminum and Copper Interconnects in Advanced Microprocessor Semiconductor Chips, EOS/ESD Symposium, 99-105, 2A.6.1 to 2A.6.11.
S. Voldman et al., Seminconductor Process and Structural Optimization of Shallow Trench Isolation-Defined and Polysilicon-Bound Source/Drain Diodes for ESD Networks, EOS/ESD Symposium, 98-151, 3A.1.1 to 2A.6.10.
Filippi Raymond
Foo Lo Keng
Manna Indrajit
Ya Tan Pee
Agilent Technologie,s Inc.
Chartered Semiconductor Manufacturing Ltd.
Purvis Sue
Quinto Kevin
LandOfFree
Triggered silicon controlled rectifier for RF ESD protection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Triggered silicon controlled rectifier for RF ESD protection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Triggered silicon controlled rectifier for RF ESD protection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4090390