Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Reexamination Certificate
2006-08-08
2006-08-08
Benson, Walter (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
C324S076280
Reexamination Certificate
active
07088088
ABSTRACT:
A method of measuring a device under test (“DUT”) includes applying a pulsed-RF input signal to the DUT and coupling an output of the DUT to a receiver having an output bandwidth selected to measure a center tone in an RF pulse response spectrum from the output of the DUT. The receiver is triggered so as to sample data output from the DUT during a window period, and stops taking data after the window period.
REFERENCES:
patent: 5059915 (1991-10-01), Grace et al.
patent: 6631341 (2003-10-01), Kameda et al.
David J. Ballo, Pulsed-RF S-Parameter Measurements Using a VNA, Agilent Technologies, Inc., Component Test Division, 5-12, 17, 18, 20, 21,37, 38, 48, 49, 52-54, 62-67, 69 (Oct. 13, 2004).
Ballo David J.
Marzalek Michael S.
Agilent Technologie,s Inc.
Benson Walter
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