Triggered narrow-band method for making pulsed-RF networking...

Details Triggered narrow-band method for making pulsed-RF networking... Triggered narrow-band method for making pulsed-RF networking...

2006-08-08

2006-08-08

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

C324S076280

Reexamination Certificate

active

07088088

ABSTRACT:
A method of measuring a device under test (“DUT”) includes applying a pulsed-RF input signal to the DUT and coupling an output of the DUT to a receiver having an output bandwidth selected to measure a center tone in an RF pulse response spectrum from the output of the DUT. The receiver is triggered so as to sample data output from the DUT during a window period, and stops taking data after the window period.

REFERENCES:
patent: 5059915 (1991-10-01), Grace et al.
patent: 6631341 (2003-10-01), Kameda et al.
David J. Ballo, Pulsed-RF S-Parameter Measurements Using a VNA, Agilent Technologies, Inc., Component Test Division, 5-12, 17, 18, 20, 21,37, 38, 48, 49, 52-54, 62-67, 69 (Oct. 13, 2004).

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