Tri-state driver circuit for automatic test equipment

Details Tri-state driver circuit for automatic test equipment Tri-state driver circuit for automatic test equipment

1984-03-02

1986-02-25

Moose, Jr., Harry E.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307262, 307257, H03K 500

Patent

active

045729719

ABSTRACT:
A tri-state driver circuit 10 for selectively driving a node of a device under test by applying and switching between two reference voltages, and for selectively operating at a high impedance output state. Two current sources 16 and 18 provide a bridge current that flows through a diode bridge 20 to establish, at nodes A and B, voltages that equal two reference voltages, DRH and DRL. The diode bridge includes resistors R11 and R16 across which the bridge current is switched to accommodate small voltage swings, and also includes clamp diodes CR3-6 to accommodate large voltage swings. A current switch 22 controls the direction of the bridge current and the selection of which of the two reference voltages appears at node A. A current sink 36, 38, and 40 monitors the average voltage of the diode bridge and adjusts it to equal the average of the two reference voltages. A feedback circuit 42, 44, and 46 monitors the higher of the voltages at nodes A and B and adjusts it to equal the higher of the two reference voltages. A transistor-diode bridge 48 operates as a buffer to generate an output signal equal in voltage to the voltage at node A. A switch controller 50 switches the transistor-diode bridge to a high impedance output state when so selected.

REFERENCES:
patent: 3770986 (1973-11-01), Orehle
patent: 4489371 (1984-12-01), Kernick

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