Tri-state circuit tester

Details Tri-state circuit tester Tri-state circuit tester

1987-03-11

1988-05-10

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324133, 324433, 307360, 307473, G01N 2742, H03K 5153

Patent

active

047438428

ABSTRACT:
A testing circuit is capable of testing digital circuits, such as gates, in logic 1, logic 0 and Hi-Z conditions. To accomplish this end two comparators are connected to the output of the digital circuit undergoing test while second inputs of both comparators are respectively connected to different reference voltages. By comparing the voltage level at the output of the digital circuit undergoing test with programmable reference voltages, unique truth tables are established for an operative digital circuit undergoing test.

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