Trend monitoring and diagnostic analysis method and system...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S034000, C702S189000, C073S865900, C340S500000, C340S679000, C377S016000, C377S027000

Reexamination Certificate

active

07664618

ABSTRACT:
The present invention such as active diagnostic algorithms is developed not only to realize the early detection of degraded vacuum pumps for the protection of pump failure but also to provide their predictive maintenance. According to the present invention, it is possible to find simple and effective ways to deal with technical problems arising from the large variability of the pump-by-pump operation characteristics and the multiple process conditions where pumps run under the idle operation and gas-loaded operation conditions alternately, especially in semiconductor manufacturing process.

REFERENCES:
patent: 6917839 (2005-07-01), Bickford
patent: 6937963 (2005-08-01), Ishii et al.
patent: 7027953 (2006-04-01), Klein
patent: 7277822 (2007-10-01), Blemel

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Trend monitoring and diagnostic analysis method and system... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Trend monitoring and diagnostic analysis method and system..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Trend monitoring and diagnostic analysis method and system... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4183268

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.