Trench-gated Schottky diode with integral clamping diode

Active solid-state devices (e.g. – transistors – solid-state diode – Schottky barrier – In integrated structure

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257655, 257334, H01L 27095, H01L 2948

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active

060780908

ABSTRACT:
A trench-gated Schottky diode of the kind described in U.S. Pat. No. 5,365,102 is provided with an integral clamping diode which protects the gate oxide from damage from high electric fields and hot carrier generation when the device is reverse-biased. The clamping diode is arranged in parallel with the normal current path through the Schottky diode and comprises a PN junction created by a diffusion of opposite conductivity to the semiconductor material of the Schottky diode. In a preferred embodiment, the clamping diode is selected to prevent significant impact ionization near the trenched gate during either steady state- or deep depletion-induced avalanche breakdown.

REFERENCES:
patent: 4982260 (1991-01-01), Chang et al.
patent: 5241195 (1993-08-01), Tu et al.
patent: 5365102 (1994-11-01), Mehrotra et al.

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