Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1997-10-28
2000-08-15
Chaudhuri, Olik
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438424, 438756, H01L 2176
Patent
active
061036358
ABSTRACT:
A process for forming a trench in a semiconductor material is provided. The process includes (a) providing a semiconductor substrate, a first mask layer adjacent the surface of the semiconductor substrate, and a second mask layer adjacent the surface of the first mask layer, the second mask layer defining a first open area and the first mask layer defining a second open area that is larger than the first open area and aligned therewith in a manner so that in the area of the openings the first mask layer is undercut with respect to the second mask layer; and (b) removing a portion of the semiconductor substrate through the open area defined by the second mask layer to form a trench in said semiconductor substrate. An IC device formed using the process is also provided.
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Chau Duc Q
Mo Brian Sze-Ki
Pardue Teina L.
Chaudhuri Olik
Duy Mai Anh
Fairchild Semiconductor Corp.
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