Trench contact process

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438221, 438268, 438337, 257329, H01L 2176

Patent

active

061107999

ABSTRACT:
A trench process for establishing a contact for a semiconductor device with trenches such as the trench and planar MOSFETs (UMOS), trench and planar IGBTs and trench MCTs which reduces the number of masks and eliminates the need for lateral diffusion into the trench channel region. Improved control of the parasitic transistor in the trench MOSFET is also achieved. The cell size/pitch is reduced relative to conventional processes which require source block and P+ masks.

REFERENCES:
patent: 5071782 (1991-12-01), Mori
patent: 5554862 (1996-09-01), Omura et al.
patent: 5623152 (1997-04-01), Majumdar et al.
patent: 5648670 (1997-07-01), Blanchard
patent: 5689128 (1997-11-01), Hshieh et al.
patent: 5693569 (1997-12-01), Ueno
patent: 5705409 (1998-01-01), Witek
patent: 5710072 (1998-01-01), Krautschneider et al.
patent: 5719409 (1998-02-01), Singh et al.
patent: 5879971 (1999-03-01), Witek
Stanley Wolf Silicon Processing for the VSLI Era vol. 2 Lattice press p. 558, 1990.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Trench contact process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Trench contact process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Trench contact process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1249242

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.