Trapped-charge non-volatile memory with uniform multilevel...

Static information storage and retrieval – Floating gate – Multiple values

Reexamination Certificate

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C365S185050, C365S185240

Reexamination Certificate

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07898852

ABSTRACT:
Methods and apparatus for programming and sensing a bi-nitride layer trapped-charge memory device in one of a first and second programmed states or one of a first and second erased states, where the first and second programmed states correspond to first and second uniform trapped charge distributions of a first charge type and the first and second erased states correspond to first and second uniform trapped charge distributions of a second charge type.

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