Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1993-12-27
1995-12-12
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324251, 414222, 250310, 25044211, C23C 1400
Patent
active
054753163
ABSTRACT:
An emission microscope is mounted on a transportable structure for use on a test floor and encloses or garages an entire automatic test equipment head to facilitate high-speed testing. Test procedures allow development of static/fixed defects over time. A video mask can be developed based on emission sites on known good devices so that only emission from defect sites of bad devices under test are shown.
REFERENCES:
patent: 4680635 (1987-07-01), Khurawa
patent: 4722298 (1988-02-01), Rubin
patent: 4755874 (1988-07-01), Esrig
patent: 4772846 (1988-09-01), Reeps
"The Image Processing Book" John Russ pp. 278-293 1992 CRC Press.
Chiang Ching-Lang
Hurley Daniel T.
Khurana Neeraj
Hypervision, Inc.
Wardas Mark
Wieder Kenneth A.
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