Transparent testing of integrated circuits

Details Transparent testing of integrated circuits Transparent testing of integrated circuits

1993-11-04

1995-11-21

Gordon, Paul P.

Excavating

371 251, G06F 1126, G11C 2900

Patent

active

054694450

ABSTRACT:
To carry out a transparent test of integrated circuits, all of the state registers and input/output registers that determine the applications' execution context are included into circular scan paths having the output of the last stage connected to the input of the first stage. Before the test, the contents of the registers are shifted via the scan path into a RAM. After the test, the saved contents of the registers are reloaded from the RAM to the registers via the scan path.

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patent: 5155432 (1992-10-01), Mahoney
"Circular Self-Test Path: A Low-Cost BIST Technique", A. Krasniewski et al, Proceedings of the 24th ACM/IEEE Design Automation Conference, 1987, pp. 407-415.
"Real Time Data Non-Destructive RAM Self Testing", D. B. Schowengerdt et al, Proceedings of the IECI 1981, Nov. 9-12, 1981, pp. 144-148.

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