Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-02-10
1998-08-04
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356373, 356382, 356386, G01B 1114
Patent
active
057902550
ABSTRACT:
A system of partially transparent light beam detectors that allow passage of the light beam through the detector allows multiple detectors that use the same reference light beam. Transparent detectors can be position sensitive detectors (PSD), photodiode arrays, or CCD imaging arrays. The detectors are attached to vibration susceptible structural elements, with detected movement of the light beam with respect to the partially transparent light beam detectors corresponding to movement of the vibration susceptible structural element.
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Berlin Andrew A.
Jackson Warren B.
Yim Mark H.
Burtzlaff Robert A.
Font Frank G.
Ratliff Reginald A.
Xerox Corporation
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