Transparent enable test circuit

Details Transparent enable test circuit Transparent enable test circuit

1992-04-20

1994-02-22

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158R, 324 731, 371 223, G01R 3128

Patent

active

052891194

ABSTRACT:
A test circuit for two level latches on an integrated circuit to be tested includes a test enable driver circuit coupled to a third level switch which is connected in series between the latches to be tested and a low voltage source. The third level switch converts the two level latches to be tested into a buffer such that data applied as an input to the two level latches appears in identical form as data at the output pin of the integrated circuit chip.

REFERENCES:
patent: 4698588 (1987-10-01), Hwang et al.
patent: 5047710 (1991-09-01), Mahoney
patent: 5122738 (1992-06-01), Simpson et al.
patent: 5130568 (1992-07-01), Miller et al.

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