Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1990-09-13
1991-12-03
Gregory, Bernarr E.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
358106, 364507, 364552, 382 8, 250563, 250572, G01N 2117
Patent
active
H00009997
ABSTRACT:
A method for measuring optical distortion in a transparency is described which comprises the steps of acquiring an analog image of a grid board through the transparency, digitizing the analog image to form a digitized image comprising a multiplicity of pixels defining the shape of the grid board as viewed through the transparency, locating on the digitized image the pixels defining the grid and determining optical distortion of the transparency by comparing the shape of the grid in the digitized image to the actual grid shape on the grid board.
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patent: 3877814 (1975-04-01), Hess et al.
patent: 4310242 (1982-01-01), Genco
patent: 4453827 (1984-06-01), Taboada
patent: 4461570 (1984-07-01), Task et al.
patent: 4647197 (1987-03-01), Kitaya et al.
patent: 4776692 (1988-10-01), Kalawsky
Merkel Harold S.
Task Harry L.
Gregory Bernarr E.
Scearce Bobby D.
The United States of America as represented by the Secretary of
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