Transparency distortion measurement process

Details Transparency distortion measurement process Transparency distortion measurement process

1990-09-13

1991-12-03

Gregory, Bernarr E.

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

358106, 364507, 364552, 382 8, 250563, 250572, G01N 2117

Patent

active

H00009997

ABSTRACT:
A method for measuring optical distortion in a transparency is described which comprises the steps of acquiring an analog image of a grid board through the transparency, digitizing the analog image to form a digitized image comprising a multiplicity of pixels defining the shape of the grid board as viewed through the transparency, locating on the digitized image the pixels defining the grid and determining optical distortion of the transparency by comparing the shape of the grid in the digitized image to the actual grid shape on the grid board.

REFERENCES:
patent: 2871756 (1959-02-01), Graves et al.
patent: 3877814 (1975-04-01), Hess et al.
patent: 4310242 (1982-01-01), Genco
patent: 4453827 (1984-06-01), Taboada
patent: 4461570 (1984-07-01), Task et al.
patent: 4647197 (1987-03-01), Kitaya et al.
patent: 4776692 (1988-10-01), Kalawsky

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