Data processing: generic control systems or specific application – Generic control system – apparatus or process – Optimization or adaptive control
Patent
1997-11-10
2000-09-12
Grant, William
Data processing: generic control systems or specific application
Generic control system, apparatus or process
Optimization or adaptive control
700240, 700 79, 700 51, 714 38, G05B 1302
Patent
active
061190470
ABSTRACT:
A process device couples to a process control loop. The process device receives a process signal. A memory in the process device contains a nominal parameter value. Computing circuitry provides an event output based upon the stored nominal value and the process signal. Output circuitry provides an output in response to the event output.
REFERENCES:
patent: Re29383 (1977-09-01), Gallatin et al.
patent: 3096434 (1963-07-01), King
patent: 3404264 (1968-10-01), Kugler
patent: 3701280 (1972-10-01), Stroman
patent: 4058975 (1977-11-01), Gilbert et al.
patent: 4099413 (1978-07-01), Ohte et al.
patent: 4337516 (1982-06-01), Murphy et al.
patent: 4517468 (1985-05-01), Kemper et al.
patent: 4530234 (1985-07-01), Cullick et al.
patent: 4635214 (1987-01-01), Kasai et al.
patent: 4642782 (1987-02-01), Kemper et al.
patent: 4644479 (1987-02-01), Kemper et al.
patent: 4649515 (1987-03-01), Thompson et al.
patent: 4663539 (1987-05-01), Sharp et al.
patent: 4707796 (1987-11-01), Calabro et al.
patent: 4777585 (1988-10-01), Kokawa et al.
patent: 4831564 (1989-05-01), Suga
patent: 4873655 (1989-10-01), Kondraske
patent: 4907167 (1990-03-01), Skeirik
patent: 4924418 (1990-05-01), Bachman et al.
patent: 4934196 (1990-06-01), Romano
patent: 4964125 (1990-10-01), Kim
patent: 4992965 (1991-02-01), Holter et al.
patent: 5005142 (1991-04-01), Lipchak et al.
patent: 5043862 (1991-08-01), Takahashi et al.
patent: 5053815 (1991-10-01), Wendell
patent: 5081598 (1992-01-01), Bellows et al.
patent: 5089984 (1992-02-01), Struger et al.
patent: 5098197 (1992-03-01), Shepard et al.
patent: 5099436 (1992-03-01), McCown et al.
patent: 5103409 (1992-04-01), Shimizu et al.
patent: 5111531 (1992-05-01), Grayson et al.
patent: 5121467 (1992-06-01), Skeirik
patent: 5122976 (1992-06-01), Bellows et al.
patent: 5130936 (1992-07-01), Sheppard et al.
patent: 5134574 (1992-07-01), Beaverstock et al.
patent: 5142612 (1992-08-01), Skeirik
patent: 5148378 (1992-09-01), Shibayama et al.
patent: 5167009 (1992-11-01), Skeirik
patent: 5175678 (1992-12-01), Frerichs et al.
patent: 5193143 (1993-03-01), Kaemmerer et al.
patent: 5197114 (1993-03-01), Skeirik
patent: 5197328 (1993-03-01), Fitzgerald
patent: 5212765 (1993-05-01), Skeirik
patent: 5214582 (1993-05-01), Gray
patent: 5224203 (1993-06-01), Skeirik
patent: 5228780 (1993-07-01), Shepard et al.
patent: 5235527 (1993-08-01), Ogawa et al.
patent: 5265031 (1993-11-01), Malczewski
patent: 5265222 (1993-11-01), Nishiya et al.
patent: 5274572 (1993-12-01), O'Neill et al.
patent: 5282131 (1994-01-01), Rudd et al.
patent: 5282261 (1994-01-01), Skeirik
patent: 5293585 (1994-03-01), Morita
patent: 5303181 (1994-04-01), Stockton
patent: 5305230 (1994-04-01), Matsumoto et al.
patent: 5311421 (1994-05-01), Nomura et al.
patent: 5317520 (1994-05-01), Castle
patent: 5327357 (1994-07-01), Feinstein et al.
patent: 5333240 (1994-07-01), Matsumoto et al.
patent: 5341307 (1994-08-01), Myhre et al.
patent: 5349541 (1994-09-01), Alexandro, Jr. et al.
patent: 5357449 (1994-10-01), Oh
patent: 5361628 (1994-11-01), Marko et al.
patent: 5365423 (1994-11-01), Chand
patent: 5367612 (1994-11-01), Bozich et al.
patent: 5384699 (1995-01-01), Levy et al.
patent: 5386373 (1995-01-01), Keeler et al.
patent: 5394341 (1995-02-01), Kepner
patent: 5394543 (1995-02-01), Hill et al.
patent: 5404064 (1995-04-01), Mermelstein et al.
patent: 5408406 (1995-04-01), Mathur et al.
patent: 5408586 (1995-04-01), Skeirik
patent: 5414645 (1995-05-01), Hirano
patent: 5419197 (1995-05-01), Ogi et al.
patent: 5430642 (1995-07-01), Nakajima et al.
patent: 5439245 (1995-08-01), Breitenbacher et al.
patent: 5440478 (1995-08-01), Fisher et al.
patent: 5467355 (1995-11-01), Umeda et al.
patent: 5469735 (1995-11-01), Watanabe
patent: 5483387 (1996-01-01), Bauhahn et al.
patent: 5485753 (1996-01-01), Burns et al.
patent: 5486996 (1996-01-01), Samad et al.
patent: 5488697 (1996-01-01), Kaemmerer et al.
patent: 5489831 (1996-02-01), Harris
patent: 5511004 (1996-04-01), Dubost et al.
patent: 5548528 (1996-08-01), Keeler et al.
patent: 5561599 (1996-10-01), Lu
patent: 5570300 (1996-10-01), Henry et al.
patent: 5572420 (1996-11-01), Lu
patent: 5598521 (1997-01-01), Kilgore et al.
patent: 5600148 (1997-02-01), Cole et al.
patent: 5640491 (1997-06-01), Bhat et al.
patent: 5671335 (1997-09-01), Davis et al.
patent: 5675504 (1997-10-01), Serodes et al.
patent: 5704011 (1997-12-01), Hansen et al.
patent: 5781878 (1998-07-01), Mizoguchi et al.
patent: 5834918 (1998-11-01), Taylor et al.
patent: 5924086 (1999-07-01), Mathur et al.
Heefner et al., "The SSCL Linac Control System", IEEE pp. 1838-1840, 1993.
Peters, "Higher Order Logic in Reasoning About Microwave Controller Software for the DSN", IEEE. pp. 53-57, 19994.
Sasaki et al., "SBUS G-Link Transmitter and Receiver Modules for an Event Builder System", IEEE. pp. 452-456, 1996.
Rietman et al., "A Production Demonstration of Wafer-to-Wafer Plasma Gate Etch Control. By Adptive Real-Time Computation of teh Over-Etch Time from in situ Process Signals", IEEE. pp. 304-308, Aug. 1995.
Sethares et al., "Analysis of Bursting in Telephony Loops with Adaptive Hybrids", IEEE. pp. 1612-1615, 1988.
Ramos et al., "Digital DS-Spread Spectrum Receiver with Reduced Computational Cost", IEEE. pp. 1039-1042, 1996.
"On-Line Statistical Process Control for a Glass Tank Ingredient Scale," by R.A. Weisman, IFAC real Time Programming, 1985, pp. 29-38.
"The Performance of Control Charts for Monitoring Process Variation," by C. Lowry et al., Commun. Statis.--Simula., 1995, pp. 409-437.
"A Knowledge-Based Approach for Detection and Diagnosis of Out-Of-Control Events in Manufacturing Processes," by P. Love et al., IEEE, 1989, pp. 736-741.
"Development of a Resistance Thermometer For Use Up to 1600.degree. C.", by M.J. de Grace et al., Cal Lab, Jul./Aug. 1996, pp. 38-41.
"Detection of Hot Spots in Thin Metal Films Using an Ultra Sensitive Dual Channel Noise Measurement System," by G.H. Massiha et al., Energy and Information Technologies in the Southeast, vol. 3 of 3, Apr. 1989, pp. 1310-1314.
"Measurement of the Temperature Fluctuation in a Resistor Generating 1/F Fluctuation," by S. Hashiguchi, Japanese Journal of Applied Physics, vol. 22, No. 5, Part 2, May 1983, pp. L284-L286.
"Check of Semiconductor Thermal Resistance Elements by the Method of Noise Thermometry", by A. B. Kisilevskii et al., Measurement Techniques, vol. 25, No. 3, Mar. 1982, New York, USA, pp. 244-246.
"A New Method of Johnson Noise Thermometry", by C.J. Borkowski et al., Rev. Sci. Instrum., vol. 45, No. 2, (Feb. 1974) pp. 151-162.
"Taking Full Advantage of Smart Transmitter Technology Now," by G. Orrison, Control Engineering, vol. 42, No. 1, Jan. 1995.
"Smart Temperature Measurement in the '90s", by T. Kerlin et al., C&I, (1990).
"Integration of Multiple Signal Validation Modules for Sensor Monitoring," Department of Nuclear Engineering, by B. Upadhyaya et al. Jul. 8, 1990 pp. 1-9.
"Johnson Noise Power Thermometer and its Application in Process Temperature Measurement," American Institute of Physics by T.V. Blalock et al., 1982, pp. 1249-1259.
"Johnson Noise Thermometer for High-Radiation and High-Temperature Environments," Fifth Symposium, by L. Oakes et al., Jan. 1988, pp. 2-23.
"Neural Networks for Sensor Validation and Plant Monitoring," International Fast Reactor Safety Meeting, by B. Upadhyaya et al., Aug. 1990, pp. 2-10.
"Neural Networks for Sensor Validation and Plantwide Monitoring," by E. Eryurek et al., vol. XII, Nos. 1-2, Jan./Feb. 1992.
"Noise Thermometry for Industrial and Metrological Applications at KFA Julich," 7th International Symposium on Temperature, by H. Brixy et al. 1992.
"In Situ Calibration of Nuclear Plant Platinum Resistance Thermometers Using Johnson Noise Methods," EPRI, Jun. 1983.
"A Decade of Progress in High Temperature Johnson Noise Thermometry," American Institute of Physic, by T.V. Blalock et al., 1982 pp. 1219-1223.
"An Integrated Architecture For Signal Validation in Power Plants," Third IEEE International Symposium on Intelligent Control, by B. Upadhaya et al., Aug. 1988, pp. 1-6.
"Application of Neural Computing
Eryurek Evren
Esboldt Steven R.
Warrior Jogesh
Grant William
Marc McDieunel
Rosemount Inc.
LandOfFree
Transmitter with software for determining when to initiate diagn does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Transmitter with software for determining when to initiate diagn, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Transmitter with software for determining when to initiate diagn will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-104706