Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-07-12
2011-07-12
Kundu, Sujoy K (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S079000, C702S108000, C702S117000, C702S159000, C702S182000, C702S184000, C702S189000, C702S190000, C370S242000, C370S248000, C324S533000, C324S534000
Reexamination Certificate
active
07979219
ABSTRACT:
The invention provides a method for testing a transmission medium used in a full-duplex communication system comprising an endpoint that comprises a transmitting end (TX) and a receiving end (RX); the method comprises the steps of: first, transmitting a transmitted signal which comprises a test signal sequence with a high auto-correlation characteristic; then, receiving a received signal, and performing a correlation operation on the test signal and the received signal; finally, according to the result of the correlation operation, determining the impedance matching condition of the transmission medium.
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http://www.everything2.net/e2node/inner%2520product.
http://everything2.net/enode2/Product%2520of%2520Sums.
Simon Haykin; “Communication System (3rd. ed. 1996),” published by John Wiley & Sons, Inc., pp. 578-589.
Hsieh Meng-Han
Lin Hou-Wei
Weng Chi-Shun
Yen Kuang-Yu
Kundu Sujoy K
REALTEK Semiconductor Corp.
Thomas Kayden Horstemeyer & Risley LLP
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