Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-04-06
2008-07-08
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C702S085000, C324S765010
Reexamination Certificate
active
07397253
ABSTRACT:
A transmission Line Pulse (TLP) device calibration method wherein the TLP device includes a pulse generator for generating a pulse, a cable having an input terminal coupled to said pulse generator, an output terminal, and at least one ground return terminal, for coupling said pulse to a device under test (DUT) when it is connected to said output terminal, and a sensor for sensing the voltage and current at a selected point in said cable to measure the pulsed voltage and current of the DUT as the pulses travel in the cable to and from the DUT. The method for calibrating said TLP device comprises selectively shorting between said output terminal and said ground return terminal and selectively creating an open circuit between these terminals to enable the calculation of the series resistance RSat said selected point in said cable and calculating the shunt resistance RSHat said selected point in said cable, respectively, when a pulse is generated, and for calculating the corrected values of current and voltage according to a formula that uses these resistance values.
REFERENCES:
patent: 6429674 (2002-08-01), Barth et al.
patent: 6943578 (2005-09-01), Sanda et al.
patent: 2007/0159186 (2007-07-01), Grund
Nguyen Ha Tran
Nixon & Peabody LLP
Vazquez Arleen M.
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