Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – With auxiliary means to condition stimulus/response signals
Reexamination Certificate
2007-01-11
2009-06-09
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
With auxiliary means to condition stimulus/response signals
C324S765010, C324S601000, C324S1540PB, C324S076110
Reexamination Certificate
active
07545152
ABSTRACT:
A Transmission Line Pulse (“TLP”) measurement system for testing devices such as integrated circuits (“ICs”), and especially for testing the electrostatic discharge (“ESD”) protection structures connected to terminals on such ICs. The TLP measurement system measures the pulsed voltage and/or current of a device under test (“DUT”) by recording voltage and/or current pulse waveforms traveling in a constant impedance cable to and from the DUT. The pulses going to and returning from the DUT are processed to create signal replicas of the voltage and current pulses that actually occurred at the DUT. Oscilloscope operating settings optimize the recording of these signal replicas by improving the measurement signal-to-noise ratio. This improved TLP system is especially useful when very short width pulses on the order of less than 10 nanoseconds are used to test the DUT's response.
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Bartels Donald L.
Dole Timothy J
Nixon & Peabody LLP
Thermo Fisher Scientific Inc.
Zhu John
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