Transistorised memory cell and an integrated memory using such a

Communications: electrical – Digital comparator systems

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307291, G11C 1140

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active

039551822

ABSTRACT:
A memory cell as required for use in the building of integrated memories, which contains bistable trigger stages formed by two transistors, with a high operational reliability, a low power consumption and an access time of less than 0.01 microseconds for a store of 64 elements, is provided. To this end, low-consumption field-effect transistors are chosen, obtained by the ion implantation of an N-type channel, in order, in each cell, to form, in addition to the two transistors of the trigger stage, a pair of transistors connected as amplifier-followers. The selection of a cell is effected by raising the potential on the word line connected to the sources of the transistors of the trigger stage.

REFERENCES:
patent: 3633182 (1972-01-01), Koo
patent: 3668656 (1972-06-01), Hoggar
Palfi, Bilevel Powered FET Memory Cell, IBM Technical Disclosure Bulletin, Vol. 14, No. 1, 6/71, pp. 261-262.

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