Transistor structure utilizing a deposited epitaxial base region

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – With base region having specified doping concentration...

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257554, 257559, 257197, H01L 2972, H01L 29161

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active

053151518

ABSTRACT:
A method of fabricating a semiconductor structure, comprising the steps of: providing a monocrystalline semiconductor device region of a first conductivity type; forming a layer of intrinsic monocrystalline semiconductor material over the device region; forming a layer of insulating material over the layer of intrinsic monocrystalline semiconductor material; forming a conductive contact over a portion of the layer of insulating material; forming an aperture extending through the conductive contact, and the layers of insulating material and intrinsic monocrystalline semiconductor material to define an aperture exposing a selected portion of the layer of intrinsic monocrystalline semiconductor material; and forming a layer of semiconductor material of a second conductivity type including a monocrystalline portion disposed epitaxially over the device region portion and a polycrystalline portion extending onto the wall of the conductive contact within the aperture.

REFERENCES:
patent: 3962717 (1976-06-01), O'Brien
patent: 4127860 (1978-11-01), Beelitz et al.
patent: 4210925 (1980-07-01), Morcom et al.
patent: 4255209 (1981-03-01), Morcom et al.
patent: 4326212 (1982-04-01), Bergeron et al.
patent: 4504332 (1985-03-01), Shinada
patent: 4546539 (1985-10-01), Beasom
patent: 4654960 (1987-04-01), McLevige et al.
patent: 4843033 (1989-06-01), Plumton et al.
patent: 4881111 (1989-11-01), Sanders et al.
patent: 4888306 (1989-12-01), Komatsu et al.
patent: 4896203 (1990-01-01), Kajikawa
patent: 4901121 (1990-02-01), Gibson et al.
patent: 4903104 (1990-02-01), Kawai et al.
patent: 4935797 (1990-06-01), Jambotkar
patent: 4939562 (1990-07-01), Adlerstein
patent: 4956689 (1990-09-01), Yuan et al.
patent: 4974045 (1990-11-01), Okita
patent: 5017990 (1991-05-01), Chen et al.
patent: 5096844 (1992-03-01), Konig et al.
Meyerson, B., "Low Temperature Silicon Epitaxy by Ultra-high Vacuum/Chemical Vapor Deposition," Appl. Phys. Lett. 48(12) Mar. 24, 1986, pp. 797-799.
Van Ommen et al., "Synthesis of Heteroepitaxial Si/CoSi2/Si Structures by Co Implantation Into Si," Appl. Phys. Lett., 53(8), Aug. 1988, p. 669.
Kuo, J. B., et al., "Two-Dimensional Transient Analysis of a Collector-UP ECL Inverter," IEEE Transactions on Computer-Aided Design, vol. 8, No. 10, Oct. 1989, pp. 1038-1049.

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