Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Patent
1997-06-03
1998-07-14
Gaffin, Jeffrey A.
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
361111, H02H 900
Patent
active
057813892
ABSTRACT:
The transistor protection device provides a circuit capable of obtaining a sufficient discharge characteristic when an electrostatic discharge voltage is applied to a semiconductor integrated circuit composed of a bipolar transistor. The protection device is provided across an emitter-base (E-B) junction of the bipolar transistor. When an electrostatic discharge voltage for biasing the E-B junction in the reverse direction is applied, the protection device is turned on and the surge current flows through the protection device such that the current which flows into the E-B junction of the transistor is greatly reduced so as to prevent electrostatic breakdown.
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"Investigation Report on Electrostatic Breakdown of Semiconductor Devices and Method of Evaluating Same", Mar., 1995, issued by Foundation Nippon Denshi Buhin Shinraisei Senta.
Fukuda Yasuhiro
Fukuzako Shinnichi
Gaffin Jeffrey A.
OKI Electric Industry Co., Ltd.
Sherry Michael J.
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