Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-06-13
2006-06-13
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C716S030000
Reexamination Certificate
active
07062410
ABSTRACT:
A system for conducting transistor performance analysis is disclosed, in which automatic graph plotting is interactively enhanced with human judgment. The system includes executing transistor performance analysis software, which receives templates specifying parameters, graph charting options, and algorithms, as well as a database of transistor values, as its inputs. The software produces an output document with linked graphs and a summary report. The software extracts, filters and applies statistical regression to large quantities of data. The software also applies statistical filtering to the data and automatically plots hundreds of charts and graphs based on the data. Graphs are color-coded to highlight relationships that suffer from unusually high noise in the data. Users can manually adjust lines on the graphs, which are automatically reflected in dependent graphs and the summary report. Changes to program methodology can be achieved by changing the template rather than by modifying the software.
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Auyeung Carrie
Winstead Charles H.
Zhou Yiqing
Bui Bryan
Carrie A. Boone, P.C.
Le Toan M.
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