Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-04-05
2011-04-05
Patel, Paresh (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07919976
ABSTRACT:
In one embodiment, a diagnostic circuit is used to test the on-resistance of a transistor.
REFERENCES:
patent: 3077551 (1963-02-01), Nelson et al.
patent: 3401306 (1968-09-01), Bolvin et al.
patent: 3701119 (1972-10-01), Waaben et al.
patent: 3895297 (1975-07-01), Jarl
patent: 3979672 (1976-09-01), Arnoldi
patent: 4645957 (1987-02-01), Baliga
patent: 4931844 (1990-06-01), Zommer
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 5486772 (1996-01-01), Hshieh et al.
patent: 5736890 (1998-04-01), Yee et al.
patent: 5959464 (1999-09-01), Qualich
patent: 6301133 (2001-10-01), Cuadra et al.
patent: 6603326 (2003-08-01), Tse et al.
patent: 6812730 (2004-11-01), Pan
patent: 6999889 (2006-02-01), Abe
“High Volgage ORing MOSFET Contoller”, Intersil ISL6144, Data Sheet, Feb. 2004, FN9131, 14 pages.
“MOSFET Diode-OR Controller”, Linear Technology, LT4351 Data Sheet, Copyright 2003.
Hightower Robert F.
Patel Paresh
Semiconductor Components Industries LLC
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