Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor
Reexamination Certificate
2006-08-30
2008-12-16
Malsawma, Lex (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Regenerative type switching device
Combined with field effect transistor
C257S107000, C257S146000, C257SE27014, C257SE29170
Reexamination Certificate
active
07465965
ABSTRACT:
A semiconductor device including: a bulk semiconductor substrate; an access transistor; a thruster formed on the bulk semiconductor substrate connecting to the access transistor; an element separating region to separate the region for the access transistor and the region for the thruster from each other; and a wiring layer connecting one of the diffused layers of the access transistor and the cathode of the thruster together through a connecting hole, the impurity region at the anode side of the thruster being composed of a p-type impurity region, an n-type impurity region, p-type impurity region, and an n-type impurity region, which are formed sequentially in the depth wise direction, with the lowermost n-type impurity region receiving the same voltage as that applied to the anode at the time of data holding.
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Fraid Nemati, et al., “A Novel Thyristor-based SRAM Cell (T-RAM) for High-Speed, Low-Voltage Giga-scale Memories”, 1999, IEDM Tech, pp. 283.
Huber Robert
Kananen Ronald P.
Malsawma Lex
Rader & Fishman & Grauer, PLLC
Sony Corporation
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