Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-07-05
2005-07-05
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06914448
ABSTRACT:
Transistor capacitance Cdtr inevitably generated between the gate and the drain of a second TFT is increased. Accordingly, an operation test of a first TFT and the second TFT can be conducted by turning on the first TFT to charge the transistor capacitance Cdtr and detecting the stored charges.
REFERENCES:
patent: 4851827 (1989-07-01), Nicholas
patent: 6307322 (2001-10-01), Dawson et al.
Cantor & Colburn LLP
Nguyen Vinh P.
Sanyo Electric Co,. Ltd.
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