Transistor and semiconductor memory using the same

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185300, C257S321000, C438S257000

Reexamination Certificate

active

06944062

ABSTRACT:
A transistor includes p-type semiconductor (12) including a projection (13a) having a pair of side walls (13b, 13b) facing each other, a gate insulation layer (15c), a pair of n-type source/drain regions (BL1, BL2), tunnel insulation layers (15a), a pair of floating gates (FG1, FG2), inter-polycrystalline insulation layers, and a control gate (CG). The root portion of the projection (13A), which virtually connects the source/drain regions (BL1, BL2) with a straight line, is higher in the concentration of the p-type impurity than the other portion. A delete voltage for deleting charges stored in the floating gate (FG) is applied between the control gate (CG) and the source/drain region (BL1, BL2), so that a delete current flows toward the control gate (CG) or the source/drain region (BL1, BL2), the charges stored being deleted.

REFERENCES:
patent: 5379255 (1995-01-01), Shah
patent: 5508544 (1996-04-01), Shah
patent: 6238976 (2001-05-01), Noble et al.
patent: 6335554 (2002-01-01), Yoshikawa
patent: 6534816 (2003-03-01), Caywood
patent: 6538925 (2003-03-01), Miida
patent: 6861315 (2005-03-01), Chen et al.
patent: 2002/0014666 (2002-02-01), Ohmi et al.
patent: 2003/0080356 (2003-05-01), Miida
patent: 2003/0095441 (2003-05-01), Miida
patent: 2000-82752 (2000-03-01), None
patent: 3283872 (2001-03-01), None
patent: 2001-160555 (2001-06-01), None
patent: 3249811 (2001-11-01), None
patent: 3249812 (2001-11-01), None
patent: WO 03/044869 (2003-05-01), None
Paper No. 29p-YC4, the 48thJoint Meeting of Engineering of Applied Physics of Japan. p88.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Transistor and semiconductor memory using the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Transistor and semiconductor memory using the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Transistor and semiconductor memory using the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3378730

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.