Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-03-29
2005-03-29
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S658000
Reexamination Certificate
active
06873922
ABSTRACT:
A transient response analysis program of a capacitor is used for making a computer execute a transient response analysis of the capacitor having impedance in a positive frequency region. This program includes at least nine steps, especially estimates impedances at zero frequency from respective impedances in positive and negative frequency regions, and reflects the result on the transient response analysis.
REFERENCES:
patent: 6741413 (2004-05-01), Ohlson
patent: 20030192542 (2003-10-01), Isaza
English translation of International Search Report for PCT/JP03/09441, dated Nov. 18, 2003.
Maejima et al., “Condenser no Koseido Toka Kairo Model”, 2000 Nen The Institute of Electronics, Information and Communication Engineers Sogo Taikai Koen Ronbunshu, Mar. 2000, Electronics 2, p. 16.
Matsushita Electric - Industrial Co., Ltd.
RatnerPrestia
Raymond Edward
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