Transient holographic indication analysis

Details Transient holographic indication analysis Transient holographic indication analysis

1987-07-10

1989-02-28

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

73656, G01B 9029

Patent

active

048079960

ABSTRACT:
A method of holographic analysis of an article is disclosed. The method involves generating holograms of an article to be analyzed and a reference article over a range of excitation energy levels and comparing the features of the holograms so generated to characterize the material and structural properties of the article.

REFERENCES:
patent: 3545259 (1970-12-01), Grant
patent: 3645129 (1972-02-01), Grant
patent: 3666344 (1972-05-01), Mottier
patent: 3762215 (1973-10-01), Aleksoff
patent: 3860346 (1975-01-01), Kersch et al.
patent: 3899921 (1975-08-01), Hockley
patent: 4080823 (1978-03-01), Stargardter
patent: 4408881 (1983-10-01), Clarady, Jr. et al.
patent: 4507766 (1985-04-01), Crostack
Doty et al. "The use of sandwich hologram interferometry for nondestructive testing of nuclear reactor components", Optical Engineering vol. 21, No. 3, pp. 542-547, Jun. 1982.
Publication: "Applications of Holography to Dynamics: Hight-Frequency Vibrations to Plates", p. 1083, Journal of Applied Mechanics, vol. 37, Dec. 1970.

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