Transient capless annealing process for the activation of ion im

Metal treatment – Compositions – Heat treating

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29575, 29576B, 29576T, 148175, 148DIG3, 148DIG22, 148DIG24, H01L 21265, H01L 21324

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active

045444170

ABSTRACT:
A method and apparatus is described for activating implants in gallium arsenide incorporating crushed gallium arsenide and hydrogen to form a gas mixture to provide an atmosphere for the gallium arsenide to be activated and a furnace for heating the crushed gallium arsenide to a first temperature and the gallium arsenide to be activated to a second temperature. The invention overcomes the problem of wafer loss at the surface by evaporation during anneal and activation of gallium arsenide.

REFERENCES:
patent: 3974002 (1976-08-01), Casey et al.
patent: 3984263 (1976-10-01), Asao et al.
patent: 4135952 (1979-01-01), Anderson et al.
patent: 4174982 (1979-11-01), Immorlica
patent: 4312681 (1982-01-01), Rupprecht et al.
Lee et al., "Characteristics of Implanted . . . Annealed . . . Atmosphere", Ion Implantation in Semiconductors 1976 (Text), Plenum Press, N.Y., 1976.
Malbon et al., "Annealing of Ion-Implanted GaAs in a Controlled Atmosphere", J. Electrochem. Soc., vol. 123, No. 9, Sep. 1976, pp. 1413-1415.
Molnar et al. "Capless Annealing of Ion Implanted InP and GaAs . . . ", Text-Gallium Arsenide and Related Compound, 1980, Inst. of Physics, London.
Woodall et al., "Proximate Capless Annealing . . . As Vapor . . . " Appl. Phys. Lett., vol 38, No. 8, Apr. 15, 1981, pp. 639-641.

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