Transient and intermittent fault insertion

Details Transient and intermittent fault insertion Transient and intermittent fault insertion

1988-04-04

1989-10-17

Fleming, Michael R.

Excavating

371 251, G06F 1100

Patent

active

048752096

ABSTRACT:
Fault insertion circuits under programmable control and resident in an integrated circuit (LSI or VLSI) insert transient and intermittent fault classes in addition to a permanent fault class into functional logic on such integrated circuit. Specific fault types programmable for each fault class include a stuck-open fault and bridging faults both wired-AND and wired-OR. The programmable fault insertion circuitry on each integrated circuit interfaces directly or indirectly with a BIT maintenance controller. In addition to verifying test software, a fault tolerant system's error detection and recovery circuits may be verified by fault insertion testing using the transient and intermittent fault insertions.

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A Logic Design Structure for LSI Testability by E. B. Eichelberger and T. W. Williams, IBM System, pp. 462-468.

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