Transforming yield information of a semiconductor...

Details Transforming yield information of a semiconductor... Transforming yield information of a semiconductor...

2006-05-02

2006-05-02

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S081000, C702S118000, C702S179000, C700S121000

Reexamination Certificate

active

07039543

ABSTRACT:
Publishable yield information can be produced by obtaining an actual yield value associated with an integrated circuit (IC) or portion of an IC formed on each one of a plurality of wafers using a semiconductor wafer fabrication process. An average yield value associated with a plurality of ICs or portions of an IC formed on each one of the plurality of wafers using the semiconductor fabrication process is determined. A transformed yield value associated with the IC or portion of an IC is generated using the actual yield value and the average yield value.

REFERENCES:
patent: 6265232 (2001-07-01), Simmons
patent: 6289257 (2001-09-01), Sekine
patent: 6393602 (2002-05-01), Atchison et al.
patent: 6537834 (2003-03-01), Weng et al.
patent: 6717431 (2004-04-01), Rathei et al.
patent: 6751519 (2004-06-01), Satya et al.
patent: 6842663 (2005-01-01), Yamada et al.

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