Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1975-02-07
1976-11-30
Larkins, William D.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
307221D, 357 30, 178 71, H01L 2714
Patent
active
039953025
ABSTRACT:
The charge generated in semiconductor material by incident radiation is transferred to an adjacent region of the semiconductor material by lowering the potential on the adjacent region of semiconductor material relative to the potential in the region where the charge was initially generated. Charge is prevented from flowing back to the region where it was generated by means of a potential barrier formed between the generation region and the adjacent region by a region of semiconductor material highly doped relative to the substrate between said adjacent region and the region in which the charge is generated.
REFERENCES:
patent: 3771149 (1973-11-01), Collins et al.
patent: 3865652 (1975-02-01), Agusta et al.
patent: 3898685 (1975-08-01), Engeler et al.
Anantha, IBM Tech. Discl. Bull, vol. 14, No. 4, Sept. 1971, p. 1234.
Tompssett et al. IEEE Trans. on Electron Devices, Nov. 1971, pp. 992-996.
Fairchild Camera and Instrument Corporation
Larkins William D.
MacPherson Alan H.
Richbourg J. Ronald
Woodward Henry K.
LandOfFree
Transfer gate-less photosensor configuration does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Transfer gate-less photosensor configuration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Transfer gate-less photosensor configuration will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1058287