Transfer circuit for operation test of LSI systems

Details Transfer circuit for operation test of LSI systems Transfer circuit for operation test of LSI systems

1988-01-25

1989-01-17

Tokar, Michael J.

Electricity: measuring and testing

Plural, automatically sequential tests

371 25, G01R 1512

Patent

active

047990040

ABSTRACT:
A transfer circuit for the operation test of an LSI system inlcudes a mode setting section for selectively setting a first or second operation mode, a plurality of first shift register circuits connected to the input terminals of function blocks of the LSI system to respectively latch input data to the function blocks in a parallel fashion in the first operation mode and shift the input data in the second operation mode, a plurality of second shift register circuits connected to the output terminals of the function blocks of the LSI system to respectively latch output data of the function blocks in a parallel fashion in the first operation mode and shift the output data in the second operation mode, and a serial transfer line for serially connecting the first and second shift register circuits.

REFERENCES:
patent: 4587480 (1986-05-01), Fasio
patent: 4594711 (1986-06-01), Thatte
patent: 4630270 (1986-12-01), Petit
patent: 4635261 (1987-01-01), Anderson
patent: 4680539 (1987-07-01), Tsai
patent: 4682329 (1987-07-01), Kluth
patent: 4688222 (1987-08-01), Blum
patent: 4698588 (1987-10-01), Hwang et al.
patent: 4698830 (1987-10-01), Berzilai
patent: 4710933 (1987-12-01), Powell
patent: 4713605 (1987-12-01), Iyer et al.
Williams et al., "Design for Testability--A Survey," Proceedings of the IEEE, vol. 71, No. 1, pp. 103-107, Jan. 1983.

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