Coded data generation or conversion – Analog to or from digital conversion – Nonlinear
Reexamination Certificate
2007-12-25
2007-12-25
Mai, Lam T. (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Nonlinear
C341S140000
Reexamination Certificate
active
11383545
ABSTRACT:
When tracing memory events the required bandwidth may be reduced by forming a logical OR of several memory event signals to determine the location of memory events. A second trace run may be made after this, tracing only the limited portions of the application where the first run indicated possible problems.
REFERENCES:
patent: 6813507 (2004-11-01), Gress et al.
Agarwala Manisha
Sohm Oliver P.
Brady W. James
Mai Lam T.
Marshall, Jr. Robert D.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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