Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Event-driven
Reexamination Certificate
2008-04-15
2008-04-15
Shah, Kamini (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Event-driven
C703S021000, C703S016000, C716S030000
Reexamination Certificate
active
09997460
ABSTRACT:
A method and system for providing centralized access to count event information from testing of a hardware simulation model within a batch simulation farm which includes simulation clients and an instrumentation server. Count event data for said hardware simulation model is received by the instrumentation server from one or more simulation clients. A first and a second counter report are generated for the hardware simulation model, in which the first and second counter reports are derived from the count event data received by the instrumentation server. The first counter report is compared to the second counter report, and responsive to this comparison, a counter difference report is generated within the instrumentation server that conveys count event trends associated with the simulation model under different simulation testcases.
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Gabele Carol Ivash
Roesner Wolfgang
Williams Derek Edward
Dillon & Yudell LLP
Gerhardt Diana R.
International Business Machines - Corporation
Shah Kamini
Silver David
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