Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2008-10-02
2010-12-07
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07848901
ABSTRACT:
A computer implemented method, data processing system, and processor are provided for tracing thermal data via performance monitoring. A performance monitor is set into a tracing mode. Temperatures are sensed by a digital thermal sensor over a time period. The sensed temperatures are stored in a data structure and a trace of the sensed temperatures is graphically displayed.
REFERENCES:
patent: 5175852 (1992-12-01), Johnson et al.
patent: 5469560 (1995-11-01), Beglin
patent: 5590061 (1996-12-01), Hollowell, II et al.
patent: 5778384 (1998-07-01), Provino et al.
patent: 5953536 (1999-09-01), Nowlin, Jr.
patent: 6029119 (2000-02-01), Atkinson
patent: 6535798 (2003-03-01), Bhatia et al.
patent: 6564328 (2003-05-01), Grochowski et al.
patent: 6609208 (2003-08-01), Farkas et al.
patent: 6778921 (2004-08-01), Keane et al.
patent: 6804632 (2004-10-01), Orenstien et al.
patent: 6889330 (2005-05-01), Chauvel et al.
patent: 6901521 (2005-05-01), Chauvel et al.
patent: 7043405 (2006-05-01), Orenstien et al.
patent: 7062304 (2006-06-01), Chauvel et al.
patent: 7127625 (2006-10-01), Farkas et al.
patent: 7197433 (2007-03-01), Patel et al.
patent: 7228508 (2007-06-01), Pippin
patent: 7263457 (2007-08-01), White et al.
patent: 7263567 (2007-08-01), Subramaniyam et al.
patent: 7275012 (2007-09-01), Hermerding, II
patent: 7287173 (2007-10-01), Hsieh
patent: 7360102 (2008-04-01), Inoue
patent: 7400945 (2008-07-01), Radhakrishnan et al.
patent: 7412353 (2008-08-01), Borkar et al.
patent: 7447920 (2008-11-01), Sharma et al.
patent: 7587262 (2009-09-01), Pippin
patent: 7596430 (2009-09-01), Aguilar et al.
patent: 2002/0104030 (2002-08-01), Ahn
patent: 2003/0110012 (2003-06-01), Orenstien et al.
patent: 2003/0117759 (2003-06-01), Cooper
patent: 2003/0126476 (2003-07-01), Greene
patent: 2003/0158697 (2003-08-01), Gold et al.
patent: 2003/0177107 (2003-09-01), Brown et al.
patent: 2003/0229662 (2003-12-01), Luick
patent: 2004/0035851 (2004-02-01), Antoniou et al.
patent: 2004/0047099 (2004-03-01), Pippin
patent: 2004/0128101 (2004-07-01), Hermerding, II
patent: 2004/0268159 (2004-12-01), Aasheim et al.
patent: 2005/0055590 (2005-03-01), Farkas et al.
patent: 2005/0216222 (2005-09-01), Inoue
patent: 2005/0216775 (2005-09-01), Inoue
patent: 2005/0228618 (2005-10-01), Patel et al.
patent: 2005/0246558 (2005-11-01), Ku
patent: 2006/0005083 (2006-01-01), Genden et al.
patent: 2006/0041766 (2006-02-01), Adachi
patent: 2006/0047808 (2006-03-01), Sharma et al.
patent: 2006/0101289 (2006-05-01), Dang et al.
patent: 2006/0289862 (2006-12-01), Yoshida et al.
patent: 2007/0055469 (2007-03-01), Rotem et al.
patent: 2007/0106428 (2007-05-01), Omizo et al.
patent: 2007/0121698 (2007-05-01), Johns et al.
patent: 2007/0121699 (2007-05-01), Johns et al.
patent: 2007/0124100 (2007-05-01), Aguilar, Jr. et al.
patent: 2007/0124101 (2007-05-01), Aguilar, Jr. et al.
patent: 2007/0124102 (2007-05-01), Aguilar, Jr. et al.
patent: 2007/0124103 (2007-05-01), Aguilar, Jr. et al.
patent: 2007/0124104 (2007-05-01), Johns et al.
patent: 2007/0124105 (2007-05-01), Johns et al.
patent: 2007/0124124 (2007-05-01), Aguilar, Jr. et al.
patent: 2007/0124355 (2007-05-01), Johns et al.
patent: 2007/0124611 (2007-05-01), Johns et al.
patent: 2007/0124618 (2007-05-01), Aguilar, Jr. et al.
patent: 2007/0124622 (2007-05-01), Johns et al.
patent: 2007/0156370 (2007-07-01), White et al.
patent: 2007/0260415 (2007-11-01), Aguilar, Jr. et al.
patent: 2007/0260893 (2007-11-01), Aguilar, Jr. et al.
patent: 2007/0260894 (2007-11-01), Aguilar, Jr. et al.
patent: 2007/0260895 (2007-11-01), Aguilar, Jr. et al.
patent: 1182538 (2002-02-01), None
patent: 2005093564 (2005-06-01), None
Viswanth et al., “Thermal Performance Challenges from Silicon to Systems”, Technology and Manufacturing Group, Intel Corporation, Aug. 22, 2000, pp. 1-16.
Smith, “Measuring temperatures on computer chips with speed and accuracy”, Analog Dialogue 33-4, 1999, pp. 1-5.
“Computer Graphics”, Wikipedia, retrieved Mar. 13 2007, pp. 1-4. http://en.wikipedia.org/wiki/Computer—graphics.
“Definition of Sense”, Merriam-Webster Online Dictionary, retrieved Dec. 11, 2006, pp. 1-2. http://www.m-w.com/dictionary/sense.
“Central processing unit”, Wikipedia, retrieved Dec. 26, 2006, pp. 1-13. http://en.wikipedia.org/wiki/Computer—processor.
Johns Charles Ray
Wang Michael Fan
Baca Matthew W.
International Business Machines - Corporation
Lau Tung S
Yee & Associates P.C.
LandOfFree
Tracing thermal data via performance monitoring does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tracing thermal data via performance monitoring, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tracing thermal data via performance monitoring will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4170245