Touch probe with reseat position system

Details Touch probe with reseat position system Touch probe with reseat position system

1996-09-25

1998-05-26

Williams, Hezron E.

Measuring and testing

Surface and cutting edge testing

Roughness

33558, 33561, G01B 700

Patent

active

057568863

ABSTRACT:
A touch probe which includes a fixed member, a movable member, a stylus, a bias means, and a reseat position system which permits the fixed member and the movable member to make contact with each other at pairs of contact points at positions which are spaced from one another. In the reseat position system, piezoelectric elements are provided which cause the fixed member and the movable member to move relatively in directions constrained by said pairs of contact points after a force applied to the movable member is removed. This realizes a touch probe which can secure high position reproducibility for a long period of time even if frictional forces act between the fixed member and the movable member.

REFERENCES:
patent: 4153998 (1979-05-01), McMurtry
patent: 4177568 (1979-12-01), Werner et al.
patent: 4702013 (1987-10-01), McMurtry
patent: 4763421 (1988-08-01), Eichtinger
patent: 4769919 (1988-09-01), Lloyd et al.
patent: 4916825 (1990-04-01), Breyer
patent: 5018280 (1991-05-01), Enderle et al.
patent: 5319858 (1994-06-01), Coy

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