Optics: measuring and testing – By polarized light examination
Patent
1998-03-03
1999-07-27
Kim, Robert H.
Optics: measuring and testing
By polarized light examination
356365, 356366, 356367, 356368, G01N 2123
Patent
active
059299932
ABSTRACT:
Disclosed is dual-polarizer based system, and method for continuously monitoring the "total film retardance" of a birefringent film, where "total film retardance" is defined as the product of the difference in the indicies of refraction in the two directions of refringence in said film, multiplied with film thickness. The preferred embodiment involves the application of Fourier analysis to signals which pass through the system and a birefringent film therein, to provide a spectrum, changes in which are indicative of changes in monitored "total film retardance". The present invention allows real time monitoring of birefringent films during manufacture thereof, and, hence, via a control system, control of film manufacturing process parameters to the end that produced films present with a relatively more consistent thickness than is the case where the present invention is not utilized.
REFERENCES:
patent: 3274882 (1966-09-01), Krieger et al.
patent: 3807868 (1974-04-01), Simila
patent: 4523848 (1985-06-01), Gorman et al.
patent: 4584476 (1986-04-01), Colombotto et al.
patent: 4909630 (1990-03-01), Gawrisch et al.
patent: 5191392 (1993-03-01), Johnson
J.A. Woollam Co. Inc.
Kim Robert H.
Lauchman Layla
Welch James D.
LandOfFree
Total film retardance monitoring system, and method of use does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Total film retardance monitoring system, and method of use, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Total film retardance monitoring system, and method of use will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-885383