Measuring and testing – Dynamometers
Reexamination Certificate
2007-12-04
2007-12-04
Thompson, Jewel (Department: 2855)
Measuring and testing
Dynamometers
Reexamination Certificate
active
11233879
ABSTRACT:
A plurality of acoustic wave sensing devices can be provided, which are mechanically simulated for implementation upon a quartz wafer substrate. The quartz wafer substrate is appropriately etched to produce a quartz diaphragm from the quartz wafer substrate. A plurality of torque SAW sensing resonators can then be located upon the quartz wafer substrate, which is based upon previously mechanically simulated devices for implementation upon the substrate, together with a quartz cover to thereby produce a quartz torque sensor package from the quartz wafer substrate.
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Liu James Zt
Magee Steven J.
Honeywell International , Inc.
Lopez Kermit D.
Ortiz Luis M.
Thompson Jewel
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