Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1989-05-04
1991-03-12
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351247, A61B 310
Patent
active
049988190
ABSTRACT:
A contour measuring apparatus and method of using the same is disclosed to measure the three-dimensional contour of a surface. Structure is provided to direct first light beams onto the surface being measured. Reflections of the first light beams from the surface are received for generating electrical output signals corresponding to electro-optically measurable optical images. The output signals are electrically processed to determine the radius of curvature of the surface being measured. A higher spatial resolution can be achieved without changing the spacing of the array of light points.
REFERENCES:
patent: 3937566 (1976-02-01), Townsley
patent: 4019813 (1977-04-01), Cornsweet et al.
patent: 4157859 (1979-06-01), Terry
patent: 4159867 (1979-07-01), Achatz et al.
patent: 4180325 (1979-12-01), Humphrey
patent: 4182572 (1980-01-01), Humphrey
patent: 4213678 (1980-07-01), Pomerantzeff et al.
patent: 4251139 (1981-02-01), Matsumura
patent: 4252420 (1981-02-01), Kohayakawa
patent: 4253743 (1981-03-01), Matsumura
patent: 4256384 (1981-03-01), Kani et al.
patent: 4259589 (1981-03-01), DiMatteo et al.
patent: 4265518 (1981-05-01), Matsumura
patent: 4272190 (1981-06-01), Shapiro
patent: 4312574 (1982-01-01), Wilms
patent: 4372655 (1983-02-01), Matsumura et al.
patent: 4407572 (1983-10-01), Humphrey
patent: 4429960 (1984-02-01), Mocilac et al.
patent: 4439025 (1984-03-01), Smirmaul
patent: 4440477 (1984-04-01), Schachar
patent: 4469416 (1984-09-01), Isono
patent: 4490022 (1984-12-01), Reynolds
patent: 4494838 (1985-01-01), Wallquist et al.
patent: 4523821 (1985-06-01), Lang et al.
patent: 4540254 (1985-09-01), Humphrey
patent: 4544248 (1985-10-01), Nunokawa
patent: 4569576 (1986-02-01), Karpov et al.
patent: 4572628 (1986-02-01), Nohda
patent: 4579430 (1986-04-01), Bille
patent: 4582404 (1986-04-01), Hamilton
patent: 4588270 (1986-05-01), Tamaki
patent: 4626089 (1986-12-01), Takahashi et al.
patent: 4641349 (1987-02-01), Flom et al.
patent: 4660946 (1987-04-01), Nakamura et al.
patent: 4660947 (1987-04-01), Amoils
patent: 4662730 (1987-05-01), Outwater et al.
patent: 4666269 (1987-05-01), Nakamura et al.
patent: 4673264 (1987-06-01), Takahashi
patent: 4679919 (1987-07-01), Itoh et al.
patent: 4685140 (1987-08-01), Mount
patent: 4692003 (1987-09-01), Adachi et al.
patent: 4699482 (1987-10-01), Utsugi
patent: 4710003 (1987-12-01), Masuda et al.
patent: 4740071 (1981-04-01), Kobayashi
patent: 4743107 (1988-05-01), Aizu et al.
patent: 4747683 (1988-05-01), Doane
patent: 4761071 (1988-08-01), Baron
Labinger Richard
Macri Timothy F.
Valovich David J.
Yoder, Jr. Paul R.
Bovernick Rodney B.
Taunton Technologies, Inc.
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