Topography measuring apparatus

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

351247, A61B 310

Patent

active

049988190

ABSTRACT:
A contour measuring apparatus and method of using the same is disclosed to measure the three-dimensional contour of a surface. Structure is provided to direct first light beams onto the surface being measured. Reflections of the first light beams from the surface are received for generating electrical output signals corresponding to electro-optically measurable optical images. The output signals are electrically processed to determine the radius of curvature of the surface being measured. A higher spatial resolution can be achieved without changing the spacing of the array of light points.

REFERENCES:
patent: 3937566 (1976-02-01), Townsley
patent: 4019813 (1977-04-01), Cornsweet et al.
patent: 4157859 (1979-06-01), Terry
patent: 4159867 (1979-07-01), Achatz et al.
patent: 4180325 (1979-12-01), Humphrey
patent: 4182572 (1980-01-01), Humphrey
patent: 4213678 (1980-07-01), Pomerantzeff et al.
patent: 4251139 (1981-02-01), Matsumura
patent: 4252420 (1981-02-01), Kohayakawa
patent: 4253743 (1981-03-01), Matsumura
patent: 4256384 (1981-03-01), Kani et al.
patent: 4259589 (1981-03-01), DiMatteo et al.
patent: 4265518 (1981-05-01), Matsumura
patent: 4272190 (1981-06-01), Shapiro
patent: 4312574 (1982-01-01), Wilms
patent: 4372655 (1983-02-01), Matsumura et al.
patent: 4407572 (1983-10-01), Humphrey
patent: 4429960 (1984-02-01), Mocilac et al.
patent: 4439025 (1984-03-01), Smirmaul
patent: 4440477 (1984-04-01), Schachar
patent: 4469416 (1984-09-01), Isono
patent: 4490022 (1984-12-01), Reynolds
patent: 4494838 (1985-01-01), Wallquist et al.
patent: 4523821 (1985-06-01), Lang et al.
patent: 4540254 (1985-09-01), Humphrey
patent: 4544248 (1985-10-01), Nunokawa
patent: 4569576 (1986-02-01), Karpov et al.
patent: 4572628 (1986-02-01), Nohda
patent: 4579430 (1986-04-01), Bille
patent: 4582404 (1986-04-01), Hamilton
patent: 4588270 (1986-05-01), Tamaki
patent: 4626089 (1986-12-01), Takahashi et al.
patent: 4641349 (1987-02-01), Flom et al.
patent: 4660946 (1987-04-01), Nakamura et al.
patent: 4660947 (1987-04-01), Amoils
patent: 4662730 (1987-05-01), Outwater et al.
patent: 4666269 (1987-05-01), Nakamura et al.
patent: 4673264 (1987-06-01), Takahashi
patent: 4679919 (1987-07-01), Itoh et al.
patent: 4685140 (1987-08-01), Mount
patent: 4692003 (1987-09-01), Adachi et al.
patent: 4699482 (1987-10-01), Utsugi
patent: 4710003 (1987-12-01), Masuda et al.
patent: 4740071 (1981-04-01), Kobayashi
patent: 4743107 (1988-05-01), Aizu et al.
patent: 4747683 (1988-05-01), Doane
patent: 4761071 (1988-08-01), Baron

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Topography measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Topography measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Topography measuring apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-444994

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.