Topography and recognition imaging atomic force microscope...

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

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C250S306000

Reexamination Certificate

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06952952

ABSTRACT:
A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.

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