Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-10-16
2007-10-16
Chawan, Sheela (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S154000, C348S042000, C348S144000, C345S427000
Reexamination Certificate
active
10600087
ABSTRACT:
Disclosed is a topographic measurement system wherein at least one satellite is used to scan the earth surface and send picture frames of a target area captured at different positions to an earth station. The picture frames are combined to produce a number of pairs of frames which constitute a stereoscopic image of the target area. Each frame pair is analyzed according to a number of visual characteristics and evaluated with a set of fitness values representative of the degrees of fitness of the frame pair to topographic measurement of the target area. A total of the fitness values is obtained from each frame pair and compared with the total values of other frame pairs. A frame pair having the highest total value is selected as a best pair. A parallax between the best pair frames is determined to produce first and second sets of line-of-sight vectors for conversion to topographic data.
REFERENCES:
patent: 4951136 (1990-08-01), Drescher et al.
patent: 5168531 (1992-12-01), Sigel
patent: 5596494 (1997-01-01), Kuo
patent: 5606627 (1997-02-01), Kuo
patent: 5764231 (1998-06-01), Ray et al.
patent: A 8-180206 (1996-07-01), None
patent: A 10-197244 (1998-07-01), None
patent: A 11-278400 (1998-10-01), None
patent: P2002-63580 (2002-02-01), None
Applicant's summarization in English of Japanese patent Nos. 8-180206; 10-197244; 11-278400 and P2002-63580.
Chawan Sheela
EC Toshiba Space Systems, Ltd.
Ostrolenk Faber Gerb & Soffen, LLP
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