Top load socket for ball grid array devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Patent

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Details

439261, 439268, G01R 104, H01R 13629, H01R 1362

Patent

active

RE0362174

ABSTRACT:
A test socket for temporary connection of a ball grid array integrated circuit device to a test circuit includes an array of contacts each including two cantilever arms biased toward each other and terminating in tips adapted to capture one ball of the device.

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