Tools for positioning semiconductor chip test probes

Details Tools for positioning semiconductor chip test probes Tools for positioning semiconductor chip test probes

1998-11-25

2000-03-07

Kramer, Dean J.

Handling: hand and hoist-line implements

Contact lens applicator

294902, B25J 700, G01R 3102

Patent

active

060329947

ABSTRACT:
In a semiconductor test equipment, in which test probes are placed into contact with bonding pads of semiconductor chips on a semiconductor wafer, an adjustment tool for adjusting the position of the test probes is disclosed. The adjustment tool comprises a cylindrical base portion, a triangular intermediate portion, and a flat, rectangular tip portion. The tool is preferably formed of used test probes comprised of tungsten. The tool is plated with a titanium nitride layer to increase the life of the tool.

REFERENCES:
patent: 3048139 (1962-08-01), Duckett
patent: 4823654 (1989-04-01), Moore
patent: 5265326 (1993-11-01), Scribner
patent: 5457392 (1995-10-01), Filipescu
patent: 5481205 (1996-01-01), Frye et al.

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