Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-03-06
2007-03-06
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C156S345420, C156S583200
Reexamination Certificate
active
10733470
ABSTRACT:
A tool for disuniting two wafers, at least one of which is for use in fabricating substrates for microelectronics, optoelectronics, or optics, the tool comprising two gripper members suitable for being fixed temporarily to respective opposite faces of the two wafers that are united with each other, and a disuniting control device suitable for moving said members relative to each other. The tool is remarkable in that the disuniting control device comprises an actuator for positively displacing said gripper members and for inducing controlled flexing in at least one of said members. This makes it easier to disunite the wafers while reducing the risk of damaging them. The invention is applicable to disuniting wafers that have been weakened by implantation, that have been temporarily bonded together, etc.
REFERENCES:
patent: 4059470 (1977-11-01), Primavesi et al.
patent: 5133824 (1992-07-01), Huberts et al.
patent: 5269873 (1993-12-01), Platzer et al.
patent: 5374564 (1994-12-01), Bruel
patent: 5447596 (1995-09-01), Hayase
patent: 6215643 (2001-04-01), Nagasaki
patent: 6351367 (2002-02-01), Mogi et al.
patent: 6436226 (2002-08-01), Omi et al.
patent: 6468879 (2002-10-01), Lamure et al.
patent: 6521078 (2003-02-01), Yanagita et al.
patent: 6746559 (2004-06-01), Ohmi et al.
patent: 2005/0150597 (2005-07-01), Henley et al.
patent: 0 432 832 (1991-06-01), None
patent: 0 989 593 (2000-03-01), None
patent: 2 572 216 (1986-04-01), None
patent: 2 124 547 (1984-02-01), None
patent: 60196644 (1995-10-01), None
patent: WO 00/26000 (2000-05-01), None
Kerdiles Sébastien
Le Vaillant Yves-Mathieu
Hollington Jermele
S.O.I.Tec Silicon on Insulator Technologies S.A.
Vazquez Arleen M.
Winston & Strawn LLP
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