Image analysis – Histogram processing – For setting a threshold
Patent
1987-11-06
1989-07-04
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
358101, 358106, H04N 718, G06K 900
Patent
active
048457639
ABSTRACT:
The disclosure reveals a computer vision technique to measure flank and crater wear of a single point cutting tool. This direct tool wear measurement method uses a microscope mounted camera to acquire an image of the tool. Special lighting of a face of the tool shows contrast of the wear region in the image. The image analysis is based on an interactive procedure utilizing a general purpose image processing system. A computer program calculates ten parameters to characterize flank and crater wear.
REFERENCES:
patent: 4493554 (1985-01-01), Pryor et aql.
patent: 4700224 (1987-10-01), Miyasaka et al.
Sata et al.; "Identification of Machine and Machining States by use of Pattern Recognition Technique", 16th CIRP International Seminar of Manufacturing Systems, 1984.
Maali et al.; "A Vision Based Technique for Automatic Tool Set-Up, Identification and Wear Measurement in CNC Lathe".
Bandyopadhyay Pulak
Blaser Dwight A.
Kaminski Brian D.
Lee Yong H.
Boudreau Leo H.
General Motors Corporation
Griffin Patrick M.
Jung Yonnie
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