Tool tips with scanning probe microscopy and/or atomic force...

Details Tool tips with scanning probe microscopy and/or atomic force... Tool tips with scanning probe microscopy and/or atomic force...

2006-09-12

2009-08-11

Nguyen, Kiet T (Department: 2881)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

07571638

ABSTRACT:
A micro-object is affixed to a mounting structure at a desired relative orientation. The micro-object may be a tool tip optimized to work with particular microscope objectives permitting the tip to be imaged along with the object surface and used to make measurements or modifications through a travel range along the microscope imaging axis equal to or nearly equal to the working distance of the given objective. The tool tip may have a lengths exceeding 80 microns, say up to several millimeters; even the longest tips can have widths of tens of microns.

REFERENCES:
patent: 5877412 (1999-03-01), Muramatsu et al.

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